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Now equipped with white light interferometry, measure from nanometres to millimetres | 3D Laser Scanning Microscope VK-X3000 Series | KEYENCE International Belgium
File:AFM (used) cantilever in Scanning Electron Microscope, magnification 3000x.JPG - Wikimedia Commons
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Jeu éducatif UPYAA Microscope de luxe , Optiques 5 zoom X100 - X200 - X3000 - X600 - X1200, avec accessoires inclus 66 pièces + Notice illustrée en couleurs, 8+ ans ALL WHAT OFFICE NEEDS
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Jeu éducatif UPYAA Microscope de luxe , Optiques 5 zoom X100 - X200 - X3000 - X600 - X1200, avec accessoires inclus 66 pièces + Notice illustrée en couleurs, 8+ ans ALL WHAT OFFICE NEEDS
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![Now equipped with white light interferometry, measure from nanometres to millimetres | 3D Laser Scanning Microscope VK-X3000 Series | KEYENCE International Belgium Now equipped with white light interferometry, measure from nanometres to millimetres | 3D Laser Scanning Microscope VK-X3000 Series | KEYENCE International Belgium](https://www.keyence.eu/Images/vk-x3000_ws_157126_pr_img_01_1940213.png)